Applied scanning probe methods IX: characterization by Luca Gavioli, Cinzia Cepek (auth.), Masahiko Tomitori,

By Luca Gavioli, Cinzia Cepek (auth.), Masahiko Tomitori, Bharat Bhushan, Harald Fuchs (eds.)

The good fortune of the Springer sequence utilized Scanning Probe equipment I–VII and the speedily increasing actions in scanning probe improvement and purposes around the globe made it a traditional step to gather additional speci c ends up in the elds of improvement of scanning probe microscopy options (Vol. VIII), characterization (Vol. IX), and biomimetics and business functions (Vol. X). those 3 volumes supplement the former set of volumes below the topic issues and provides perception into the hot paintings of prime experts of their respective elds. Following the culture of the sequence, the chapters are prepared round concepts, characterization and biomimetics and business functions. quantity VIII makes a speciality of novel scanning probe concepts and the knowledge of tip/sample interactions. issues contain close to eld imaging, complicated AFM, s- cializedscanningprobemethodsinlifesciencesincludingnewselfsensingcantilever structures, mixtures of AFM sensors and scanning electron and ion microscopes, calibration equipment, frequency modulation AFM for program in beverages, Kelvin probe strength microscopy, scanning capacitance microscopy, and the dimension of electric delivery houses on the nanometer scale. Vol. IX makes a speciality of characterization of fabric surfaces together with structural in addition to neighborhood mechanical characterization, and molecular platforms. the quantity covers a extensive spectrum of STM/AFM investigations together with fullerene layers, strength spectroscopy for probing fabric homes regularly, organic lms .and cells, epithelial and endothelial layers, clinical comparable structures resembling amyloidal aggregates, phospholipid monolayers, inorganic lms on aluminium and copper - ides,tribological characterization, mechanical homes ofpolymernanostructures, technical polymers, and close to eld optics.

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343 Subject Index . . . . . . . . . . . . . . . . . . 371 Contents – Volume IV 23 Scanning Probe Lithography for Chemical, Biological and Engineering Applications Joseph M. Kinsella, Albena Ivanisevic . . . . . . . . 1 Nanotribological Characterization of Human Hair and Skin Using Atomic Force Microscopy (AFM) Bharat Bhushan, Carmen LaTorre . . . . . . . . . 35 Nanofabrication with Self-Assembled Monolayers by Scanning Probe Lithography Jayne C.

183 Scanning Probe Microscopy Applied to Ferroelectric Materials Oleg Tikhomirov, Massimiliano Labardi, Maria Allegrini . . . 217 Morphological and Tribological Characterization of Rough Surfaces by Atomic Force Microscopy Renato Buzio, Ugo Valbusa . . . . . . . . . . . 261 AFM Applications for Contact and Wear Simulation Nikolai K. Myshkin, Mark I. Petrokovets, Alexander V. Kovalev . 299 AFM Applications for Analysis of Fullerene-Like Nanoparticles Lev Rapoport, Armen Verdyan .

429 Capacitance Storage Using a Ferroelectric Medium and a Scanning Capacitance Microscope (SCM) Ryoichi Yamamoto . . . . . . . . . . . . . . 439 Room-Temperature Single-Electron Devices formed by AFM Nano-Oxidation Process Kazuhiko Matsumoto . . . . . . . . . . . . . 459 Subject Index . . . . . . . . . . . . . . . . . . 469 14 15 16 Contents – Volume II 1 2 3 4 5 Higher Harmonics in Dynamic Atomic Force Microscopy Robert W. Stark, Martin Stark .

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